APPLICATION OF METHODS FOR MODEL RECOGNITION AND ANALYSIS OF DATA IN THE CLASSIFICATION OF ELECTRONIC ELEMENTS OF RELIABILITY
Keywords:
data analysis, highly responsible electronicAbstract
The application of image recognition (RO) and data analysis methods is appropriate in the research of highly integrated IPs (GIS, microcontrollers, microprocessors, memories, FPGAs and other SGIs), complex and highly responsive electronic equipment whose full test reliability is difficult or unreliable [1]. PO can be applied at different stages - at the output of the output (output control), after applying "bin-in" loads, in the reception and transmission procedures, etc.
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